MEMS Development / MEMS Manufacturing

MEMS Assembly & Test

MEMS Comb Drive
Magnified MEMS
Comb Drive

MEMS Assembly

Micralyne utilizes a variety of MEMS technologies to assemble and package a wide range of customer products. From MEMS bioanalytical and commercial printing component assemblies to MEMS optical component subassemblies, Micralyne has the expertise, experience and tool-set to successfully assemble most MEMS-based products.

MEMS assembly capabilities include:

Wire Bonding
High speed automatic wedge Aluminum/Gold deep access
wire bonding equipped with PRS
Wire size capability from 17 - 75 microns
Substrate size up to 200 mm X 150 mm
Position repeatability +/- 3 microns typically
Multi-chip, multi-module wire bonding capability
Wire bonding capability from dice to package and dice to sub-mount
Packaging capabilities include flex cables, mounting substrates, packages compatible with optical technologies
Dicing
Standard silicon dicing 4” & 6”
Quartz dicing
Standard glass dicing up to 6”
Silicon/Glass stacked dicing
Glass/Glass stacked dicing
Alumina dicing

Micralyne also offers other customized MEMS assembly capabilities. Please contact us for more information.

MEMS Testing

Micralyne employs its OEM experience to build and configure final product and testing instrumentation; ensuring customer requirements have been met.

Micralyne provides customer configuration of MEMS product assemblies and implements custom testing systems unique to each customer. Micralyne also offers in house process engineering services for the development and improvement of MEMS assembly and test processes. This maximizes yields and efficiency enabling a lower cost & higher quality product.

MEMS Test & Characterization Capabilities
SEM (Scanning Electron Microscope) with x-ray analysis
Thin film stress measurement with thermal cycling capability
Line width measurement
Sheet resistance measurement
Optical profiler using white light interferometry
Surface profilers
Film thickness measurements
CV measurements
Wire bond pull test
Electrical test – probe station
Automated visual inspection
Real time measure and data acquisition

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