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Micralyne Newslyne - May 2008
about micralyne mems capabilities event calendar news releases mems resources contact us


Welcome to the May Edition of Newslyne, Micralyne's quarterly e-newsletter. In this edition learn about characterization, testing and qualification in the CEO Message, and learn about Metrology and Characterization Tools in Micralyne from our engineers.

Award Photos from iCORE Alberta Electrical and Computer Engineering Graduate Research Symposium
Micralyne Inc - Presents Oral Communication Award at University of Alberta

(click here for details)

Mahmood R. Minhas Recieves Award John Crabtree introduces Micralyne Micralyne Display at University of Alberta Symposium
Mahmood R. Minhas Recieves Award John Crabtree introduces Micralyne Micralyne Display at University of Alberta Symposium


Contents - May 2008

:: Message from the CEO
:: Glen Fitzpatrick and Siamak Akhlaghi - Metrology and Characterization Tools
:: Micralyne News & Events


Message from the CEO

Mr. Chris Lumb, President & CEO, Micralyne
Mr. Chris Lumb, President & CEO, Micralyne
Characterization, testing, and qualification: dry topic? Some may think so, but at Micralyne we know that it's a critical part of successful MEMS product development and manufacturing. Our customers want confirmation that they're getting what they ordered, and being able to assure this for micron sized parts requires that we use a variety of specialized tools and practices.

MEMS products can provide tremendous economic benefits to their users. As you've heard us say before, MEMS makes products better, smaller, and less expensive. Better comes from more capability, where MEMS can do things that non-MEMS products simply can't do. Smaller gives MEMS products fit and function in more environments than conventional products can, and provides benefit in new applications areas. Cost, the final area, results from MEMS products providing better functionality at lower costs than conventional products.
::Continued...

- Chris Lumb, President & CEO, Micralyne -


Metrology and Characterization Tools in Micralyne

Alcatel Logo
MEMS (MicroElectroMechanical Systems) are more difficult to characterize than integrated circuits due to the need to gauge sensing and/or actuation performance, therefore characterization of the constituent structures is a critical part of MEMS development and manufacturing. Integrated circuits are created using stacks of patterned thin films which constitute the semiconducting, conducting and dielectric layer. This requires considerable control of a number of parameters with respect to material properties and structural size.

MEMS (MicroElectroMechanical Systems) use films of these types as well as an esoteric suite of films to make the suspended and freed parts which enable movement of the device. This adds a level of complexity to the characteristics which require measurement and control to realize functional devices. ::Continued...

- By Glen Fitzpatrick and Siamak Akhlaghi, Micralyne Inc. -



MEMS News, Events & Resources

MEMS Foundry Micralyne Named a Finalist for the 2008 CATAAlliance Innovation and Leadership Awards
Micralyne Inc., a world leading MEMS foundry, has recently learned that it has been selected as a finalist for the 2008 CATAAlliance Innovation and Leadership Award in the category of Private Sector Leadership in Advanced Technology.
::Read Full Release


Micralyne Inc - Presents Oral Communication Award at University of Alberta
Micralyne Inc. was pleased to be on hand at the 2008 iCORE Alberta Electrical and Computer Engineering Graduate Research Symposium. Micralyne had the pleasure of presenting the Oral Communication Award at the graduate research symposium.
::Read Full Release


Contact Information: Micralyne Inc.
1911-94 Street, Edmonton, Alberta, Canada, T6N 1E6
Phone: 1.780.431.4400 Fax: 1.780.431.4422
Email: info(at)micralyne.com